A new modulating method for electronic speckle patterns interferometry(ESPI) is presented.When the test object is tilted a small angle,a series of parallel interference fringes are formed.Then,carrier fringes are introduced.While the object is loaded,the carrier will be curved due to the modulation of deformation of the object surface.With the carrier and the modulated carrier,the phase correlated with deformation of object can be derived by Fourier transform.Then the displacement field can be obtained exactly.The principle of the tilted-object method is presented.A typical experiment using a centrally loaded clamped circular plate is completed.The theoretic analysis and the experimental results prove that the tilted-object method can modulate speckle pattern very well and the displacement fields can be obtained effectively.