Nano-vanadium dioxide(VO2) thin films are prepared by thermal annealing VO2 thin films deposited by dual ion beam sputtering.X-ray diffraction and scanning electronic microscopy were used to measure the crystal structure and investigate the morphology of thin film,respectively.Fourier Transform Infrared spectrum were used to measure and analyze the optical phase transition properties are measured and analyzed by use of fourier transform infrared spectrum.The results show that nano-vanadium dioxi...