In this study,nanocrystalline silicon thin films and amorphous silicon thin films are grown on both the single crystalline silicon and glass substrates by plasma-enhanced chemical vapor deposition(PEVCO).Raman scattering is used on those films by three different excitation wavelengths,from red to near ultraviolet region.It shows that the Raman spectrum is different by varying the incident wavelength based on analyses of the incident light intensity energy,the photo absorption coefficient of sili...