基于虚像相位阵列布里渊光谱仪的自由光谱范围校准方法
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暨南大学

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O433.1

基金项目:

基于电磁诱导透明效应的高分辨率布里渊分布式光纤传感技术


Calibration Method for Free Spectral Range based on Virtual Image Phased Array Brillouin Spectrometer
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Jinan University

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High-resolution Brillouin distributed fiber sensing technology based on electromagnetic induction transparency effect.

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    摘要:

    基于虚像相位阵列(VIPA)的布里渊光谱技术是一种高分辨率光谱探测技术。它具有实时监测、高灵敏度等优点。目前该技术主要通过VIPA的自由光谱范围(FSR)与像素映射关系获取频率信息。然而,入射光角度变化会造成FSR波动。传统的测量手段均基于FSR不变的前提下进行,不能对测量过程中入射角度改变导致的FSR变化进行实时标定,从而造成测量结果出现误差。本文针对这一问题,通过分析布里渊散射特点和VIPA干涉原理,提出基于单模光纤布里渊频移的FSR实时校准方法以及相应的像素与频率映射关系计算方法。该方法利用单模光纤的布里渊斯托克斯与反斯托克斯光频移作为参考,减小由入射光角度变化引起的FSR波动造成的频率测量误差。实验利用该方法实现了532 nm波长下不同折射率环境中的微纳光纤布里渊频移的快速测量。

    Abstract:

    The Brillouin spectroscopy technique based on Virtual Image Phased Array (VIPA) is a high-resolution spectral detection technique. It offers advantages such as real-time monitoring and high sensitivity. Currently, this technique primarily relies on the mapping relationship between the Free Spectral Range (FSR) of VIPA and the pixel to obtain frequency information. However, variations in the incident light angle can cause fluctuations in the FSR. Traditional measurement methods are based on the assumption of constant FSR and do not provide real-time calibration for FSR changes caused by variations in the incident angle, resulting in measurement errors. In this paper, we address this issue by analyzing the characteristics of Brillouin scattering and the interference principle of VIPA. We propose a real-time calibration method for FSR based on the Brillouin frequency shift of a single-mode fiber and a corresponding calculation method for pixel-to-frequency mapping. This method utilizes the Brillouin Stokes and anti-Stokes frequency shifts of a single-mode fiber as references to reduce frequency measurement errors caused by FSR fluctuations due to changes in the incident light angle. Experimental results demonstrate the rapid measurement of micro/nanofiber Brillouin frequency shift in different refractive index environments at a wavelength of 532 nm using this method.

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  • 收稿日期:2023-06-19
  • 最后修改日期:2023-09-13
  • 录用日期:2023-09-28
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